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- 题名/责任者:
- Characterization of semiconductor heterostructures and nanostructures / edited by Carlo Lamberti.
- 出版发行项:
- Amsterdam ; Oxford : Elsevier, 2008.
- ISBN:
- 9780444530998 (hbk.)
- ISBN:
- 0444530991 (hbk.)
- 载体形态项:
- ix, 486 p., [3] p. of plates : ill. (some col.) ; 25 cm.
- 附加个人名称:
- Lamberti, Carlo.
- 论题主题:
- Semiconductors.
- 论题主题:
- Heterostructures.
- 论题主题:
- Nanostructures.
- 中图法分类号:
- O471
- 书目附注:
- Includes bibliographical references and index.
- 内容附注:
- Introduction: the interdisciplinary nature of nanotechnology and its need to exploit frontier characterization techniques / Carlo Lamberti -- Ab initio studies of structural and electronic properties / Maria Peressi, Alfonso Baldereschi, and Stefano Baroni -- Electrical characterization of nanostructures / Anna Cavallini and Laura Polenta -- Strain and composition determination in semiconducting heterostructures by high-resolution X-ray diffraction / Claudio Ferrari and Claudio Bocchi -- Transmission electron microscopy techniques for imaging and compositional evaluation in semiconductor heterostructures / Laura Lazzarini, Lucia Nasi, and Vincenzo Grillo -- Accessing structural and electronic properties of semiconductor nanostructures via photoluminescence / Stefano Sanguinetti, Mario Guzzi, and Massimo Gurioli -- Power-dependent cathodoluminescence in III-nitrides heterostructures: from internal field screening to controlled band-gap modulation / Giancarlo Salviati, Francesca Rossi, Nicola Armani, Vincenzo Grillo, and Laura Lazzarini -- Raman spectroscopy / Daniel Wolverson -- X-ray absorption fine structure in the study of semiconductor heterostructures and nanostructures / Federico Boscherini -- Nanostructures in the light of synchrotron radiation: surface-sensitive X-ray techniques and anomalous scattering / Till Metzger, Vincent Favre-Nicolin, Gilles Renaud, Hubert Renevier, and Tobias Schülli -- Grazing incidence diffraction anomalous fine structure in the study of structural properties of nanostructures / Maria Grazia Proietti, Johann Coraux, and Hubert Renevier -- The role of photoemission spectroscopies in heterojunction research / Giorgio Margaritondo -- ESR of interfaces and nanolayers in semiconductor heterostructures / Andre Stesmans and Valery V. Afanasv.
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