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西文图书1.Testing for small-delay defects in nanoscale CMOS integrated circuits / TN432/BG2
馆藏复本:1
可借复本:0 editors, Sandeep K. Goel, Krishnendu Chakrabarty.
CRC Press, c2014.
(0) 馆藏
馆藏复本:1
可借复本:0 editors, Sandeep K. Goel, Krishnendu Chakrabarty.
CRC Press, c2014.
(0) 馆藏