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西文图书1.Proceedings TP274-53/I3
馆藏复本:2
可借复本:2 International Test Conference
IEEE 1990
(0) 馆藏 -
西文图书2.Proceedings TP274-53/I4
馆藏复本:1
可借复本:1 International Test Conference
IEEE 1991
(0) 馆藏 -
西文图书3.Proceedings TP274-53/I2
馆藏复本:1
可借复本:1 International Test Conference
IEEE 1989
(0) 馆藏 -
西文图书4.The three faces of test :design,characterizationproduction:proceedings TP274-53/I11
馆藏复本:2
可借复本:2 International Test Conference
IEEE,Computer Society.Pr. 1984
(0) 馆藏