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西文图书1.2008 proceedings, Annual Reliability and Maintainability Symposium : Alexandria, Virginia, USA, 2... TN06-53/BR15
馆藏复本:1
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Institute of Electrical and Electronics Engineers, c2008.
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西文图书2.2009 proceedings, Annual Reliability and Maintainability Symposium : Alexandria, Virginia, USA, 2... TN06-53/BR16
馆藏复本:1
可借复本:0 Reliability and Maintainability Symposium
Institute of Electrical and Electronics Engineers, c2008.
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西文图书3.2006 Reliability and Maintainability : 23-26 January, 2006, Newport Beach, California, USA / TN06-53/R17
馆藏复本:1
可借复本:0 Reliability and Maintainability.
IEEE, c2006.
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西文图书4.Proceedings TN06-53/R4
馆藏复本:1
可借复本:1 Reliability and Maintainability Symposium
IEEE Pr. c1991
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西文图书5.Proceedings TN06-53/R9
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IEEE 1997.
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西文图书6.Reliability Physics TN06-53/I4
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可借复本:1 International Reliability Physics Symposium
IEEE Pr. c1991
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西文图书7.Proceedings TN06-53/R12
馆藏复本:1
可借复本:1 Annual Reliability and Maintainability Symposium (2002 : Washington)
IEEE 2002
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西文图书8.Annual reliability & maintainability symposium 1995 proceedings TN06-53/R7
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IEEE 1995.
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西文图书9.Reliability Physics TN06-53/I3
馆藏复本:1
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IEEE c1990
(0) 馆藏 -
西文图书10.Proceedings Annual TN06-53/R2
馆藏复本:1
可借复本:1 Reliability and Maintainability Symposium
IEEE c1987
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西文图书11.Proceedings TN06-53/R1
馆藏复本:2
可借复本:2 Reliability and Maintainability Symposium
IEEE 1984
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西文图书12.Reliability Physics 1985 TN06-53/I2
馆藏复本:1
可借复本:1 International Reliability Physics Symposium
IEEE 1985
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西文图书13.2004 Reliability and Maintainability : 26-29 January, 2004, Los Angeles, California, USA / TN06-53/R16
馆藏复本:1
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IEEE, c2003.
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西文图书14.Proceedings of the ...... TN06-53/R11
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IEEE 1999.
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西文图书15.Proceedings TN06-53/R3
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可借复本:1 Reliability and Maintainability Symposium
IEEE c1990
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西文图书16.Proceedings TN06-53/R13
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可借复本:1 Annual Reliability and Maintainability Symposium (2001 : Pennsylvania)
IEEE 2001
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西文图书17.Proceedings of the ... TN06-53/R8
馆藏复本:1
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IEEE 1997.
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西文图书18.Proceedings TN06-53/R6
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IEEE 1994.
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西文图书19.Proceedings TN06-53/R5
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可借复本:1 Reliability and Maintainability Symposium
IEEE c1992
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西文图书20.1989 proceedings, Annual Reliability and Maintainability Symposium : Alexandria, Virginia, USA, 2005 TN06-53/R15
馆藏复本:1
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Institute of Electrical and Electronics Engineers, c2005.
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