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西文图书1.CMOS time-mode circuits and systems : fundamentals and applications / TN432/BY1
馆藏复本:1
可借复本:0 edited by Fei Yuan ; Krzysztof Iniewski, managing editor.
CRC Press, c2016
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西文图书2.Testing for small-delay defects in nanoscale CMOS integrated circuits / TN432/BG2
馆藏复本:1
可借复本:0 editors, Sandeep K. Goel, Krishnendu Chakrabarty.
CRC Press, c2014.
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