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西文图书1.Accelerated reliability and durability testing technology / TB114.3/BK1
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可借复本:1 Lev M. Klyatis.
Wiley, c2012.
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西文图书2.Progressive censoring : theory, methods, and applications / O212.7/BB1
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可借复本:1 N. Balakrishnan, Rita Aggarwala.
Birkh鑑user, c2000.
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