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西文图书1.Terrestrial neutron-induced soft errors in advanced memory devices / TP333.5/BN1
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World Scientific, c2008.
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西文图书2.High frequency electromagnetic dosimetry / R144.1/BS1
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可借复本:0 David A. S鈇nchez-Hern鈇ndez, editor.
Artech House, c2009.
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