机读格式显示(MARC)

• 000 00859nam2 2200253 4500

• 001 0000228685

• 005 20060626083827.0

• 008 060626s2005 ne a b 001 0 eng

• 020 __ |a 1-4020-3207-2(cloth) |c CNY1080.00

• 040 __ |a BUPTL

• 041 0_ |a eng

• 093 __ |a TN4 |v 4

• 100 1_ |a Larsson, Erik, |d 1966-.

• 245 10 |a Introduction to advanced system-on-chip test design and optimization / |c by Erik Larsson.

• 260 __ |a Dordrecht ; |a [London] : |b Springer, |c 2005.

• 300 __ |a xv, 388 p. : |b ill. ; |c 25 cm.

• 440 0_ |a Frontiers in electronic testing |v 29.

• 504 __ |a Includes bibliographical references and index.

• 650 _0 |a Integrated circuits |x Design and construction.

• 650 _0 |a Systems on a chip |x Testing.

• 810 99060626s2006 enka b o10100 eng d |c 20060626

• 851 _0 |a CN |b HIEL

• 905 __ |a HIEL |d TN4/L6

• 999 __ |a 22 |b 1 |e 200602