机读格式显示(MARC)

• 000 00536nam2 2200181 4500

• 001 0000247027

• 020 __ |a |c ￥0.00

• 041 0_ |a eng

• 093 __ |a TP274-53 |v 4

• 245 1_ |a The three faces of test :design,characterizationproduction:proceedings |c International Test Conference |g |A THETHREE,CHARACTE |F INTERNAT

• 250 __ |a

• 260 __ |a Silver Spring |b IEEE,Computer Society.Pr. |c 1984

• 300 __ |a XXXI,886c28cm

• 440 0_ |a

• 700 _0 |a International Test Conference |A INTERNAT |4 著

• 851 _0 |a CN |b HIEL

• 905 __ |a HIEL |d TP274-53/I11

• 999 __ |b 1