机读格式显示(MARC)
- 000 00450nam2 2200181 4500
- 245 1_ |a Proceedings |c International Test Conference |g |A PROCEEDI |F INTERNAT
- 260 __ |a Washington,D.C. |b IEEE |c 1989
- 700 _0 |a International Test Conference |A INTERNAT |4 著
- 905 __ |a HIEL |d TP274-53/I2