机读格式显示(MARC)

• 000 00981nam a22002898a 4500

• 001 0000375079

• 003 OCoLC

• 005 20100926151700.0

• 008 081027s2009 si a b 001 0 eng

• 010 __ |a 2008045600

• 020 __ |a 9780470824078 (cloth)

• 020 __ |a 0470824077 (cloth)

• 035 __ |a (OCoLC)264669592

• 040 __ |a DLC |c DLC |d BTCTA |d YDXCP |d C#P

• 050 00 |a TK7871.99.M44 |b K47 2009

• 082 00 |a 621.39/5 |2 22

• 090 __ |a TN432/BK1

• 093 __ |a TN432 |2 4

• 100 1_ |a Ker, Ming-Dou.

• 245 10 |a Transient-induced latchup in CMOS integrated circuits / |c Ming-Dou Ker and Sheng-Fu Hsu.

• 260 __ |a Singapore ; |a Hoboken, NJ : |b Wiley ; |a [Piscataway, NJ] : |b IEEE Press, |c c2009.

• 300 __ |a xiii, 249 p. : |b ill. ; |c 26 cm.

• 504 __ |a Includes bibliographical references and index.

• 650 _0 |a Metal oxide semiconductors, Complementary |x Defects.

• 650 _0 |a Metal oxide semiconductors, Complementary |x Reliability.

• 700 1_ |a Hsu, Sheng-Fu.

• 920 __ |a 233030 |z 2