机读格式显示(MARC)

• 000 00581nam2 2200181 4500

• 001 0000247396

• 020 __ |a 0-444-88619-2 |c ￥32.40

• 041 0_ |a eng

• 093 __ |a O474-53 |v 4

• 245 1_ |a Symposium on Science and Technology of Defects in Silicon of the 1989 I-MRS Conference |c C.a.J.ammerlaan, a.Charter,P.wagner. |g |A SYMPOSIU |F CAJAMMER,ACHARTER,PWAGNER

• 250 __ |a

• 260 __ |a Amsterdam |b North-Helland |c 1989

• 300 __ |a 505c25cm

• 440 0_ |a

• 700 _0 |a C.a.J.ammerlaan, a.Charter,P.wagner. |A CAJAMMER,ACHARTER,PWAGNER |4 著

• 851 _0 |a CN |b HIEL

• 905 __ |a HIEL |d O474-53/S2

• 999 __ |b 1