机读格式显示(MARC)

• 000 00971nam2 2200277 4500

• 001 0000228773

• 005 20060627140841.0

• 008 060627s2005 ne a b 001 0 eng d

• 020 __ |a 0-387-25742-X(cloth) |c CNY1200.00

• 040 __ |a BUPTL

• 041 0_ |a eng

• 093 __ |a TN431.1 |v 4

• 100 1_ |a Kabisatpathy, Prithviraj.

• 245 1_ |a Fault diagnosis of analog integrated circuits / |c by Prithviraj Kabisatpathy, Alok Barua and Satyabroto Sinha.

• 260 __ |a Dordrecht : |b Springer, |c c2005.

• 300 __ |a ix, 182 p. : |b ill. ; |c 25 cm.

• 440 0_ |a Frontiers in electronic testing ; |v 30.

• 504 __ |a Includes bibliographical references and index.

• 650 _0 |a Linear integrated circuits.

• 650 _0 |a Linear integrated circuits |x Testing.

• 700 1_ |a Barua, Alok. |A Barua, Alok

• 700 1_ |a Sinha, Satyabroto. |A Sinha, Satyabroto

• 810 99060627s2006 enka b o10100 eng d |c 20060627

• 851 _0 |a CN |b HIEL

• 905 __ |a HIEL |d TN431.1/K1

• 999 __ |a 22 |b 1 |e 200602