机读格式显示(MARC)
- 000 00473nam2 2200181 4500
- 245 1_ |a Points Defects in Semiconductors II:Experimental Aspects. |c Bourgoin,Jacques |g |A POINTSDE |F BOURGOIN,JACQUES
- 260 __ |a Berlin |b Springer-Verlag |c 1983
- 700 _0 |a Bourgoin,Jacques |A BOURGOIN,JACQUES |4 著
- 905 __ |a HIEL |d O474/L1