机读格式显示(MARC)

• 000 00444nam2 2200181 4500

• 001 0000245312

• 020 __ |a |c ￥0.00

• 041 0_ |a eng

• 093 __ |a TP331.1 |v 4

• 245 1_ |a Design of testable logic circuits |c Bennetts, R.G. |g |A DESIGNOF |F BENNETTS,RG

• 250 __ |a

• 260 __ |a London |b Addison-Wesley Pub |c 1984

• 300 __ |a 164c24 m

• 440 0_ |a

• 700 _0 |a Bennetts, R.G. |A BENNETTS,RG |4 著

• 851 _0 |a CN |b HIEL

• 905 __ |a HIEL |d TP331.1/B2

• 999 __ |b 1