机读格式显示(MARC)

• 000 00780cam a22002414a 4500

• 001 0000374771

• 005 20101014145900.0

• 008 040108s2004 maua b 001 0 eng

• 010 __ |a 2004041373

• 020 __ |a 1402077521 (alk. paper)

• 040 __ |a DLC |c DLC |d DLC

• 050 00 |a TK7895.M4 |b H343 2004

• 082 00 |a 004.5/3 |2 22

• 090 __ |a TP333.8/BH1

• 093 __ |a TP333.8 |2 4

• 100 1_ |a Hamdioui, Said.

• 245 10 |a Testing static random access memories : |b defects, fault models, and test patterns / |c by Said Hamdioui.

• 260 __ |a Boston : |b Kluwer Academic, |c 2004.

• 300 __ |a xx, 221 p. : |b ill. ; |c 25 cm.

• 440 _0 |a Frontiers in electronic testing

• 504 __ |a Includes bibliographical references and index.

• 650 _0 |a Random access memory |x Testing.

• 920 __ |a 233030 |z 2