机读格式显示(MARC)
- 000 00918cam a2200253 a 4500
- 008 130730s2014 flu b 001 0 eng
- 020 __ |a 9781439829417 : |c CNY1000.35
- 040 __ |a DLC |b eng |c DLC |e rda |d DLC
- 050 00 |a TK7871.99.M44 |b T43 2014
- 082 00 |a 621.39/732 |2 23
- 245 00 |a Testing for small-delay defects in nanoscale CMOS integrated circuits / |c editors, Sandeep K. Goel, Krishnendu Chakrabarty.
- 260 __ |a Boca Raton : |b CRC Press, |c c2014.
- 300 __ |a xv, 247 p. ; |c 25 cm.
- 490 0_ |a Devices, circuits, and systems
- 504 __ |a Includes bibliographical references and index.
- 650 _0 |a Metal oxide semiconductors, Complementary |x Testing.
- 700 1_ |a Goel, Sandeep K., |e editor of compilation.
- 700 1_ |a Chakrabarty, Krishnendu, |e editor of compilation.