机读格式显示(MARC)

• 000 02624cam a2200265 a 4500

• 001 0000493393

• 005 20131126102000.0

• 008 120319s2012 enka b 001 0 eng

• 010 __ |a 2012011804

• 020 __ |a 9781119979555

• 020 __ |a 1119979552

• 040 __ |a DLC |b eng |c DLC |e rda |d DLC

• 050 00 |a TK7876 |b .D84 2012

• 082 00 |a 537.5/344 |2 23

• 090 __ |a TM931/BD1

• 093 __ |a TM931 |2 5

• 100 1_ |a Dunsmore, Joel P.

• 245 10 |a Handbook of microwave component measurements : |b with advanced VNA techniques / |c Joel P. Dunsmore, Ph. D., Agilent Fellow, Agilent Technologies, USA.

• 260 __ |a Chichester, West Sussex, United Kingdom : |b Wiley, |c 2012.

• 300 __ |a xxiii, 611 p. : |b ill. ; |c 25 cm.

• 504 __ |a Includes bibliographical references and index.

• 520 __ |a "A practical guide to the most modern techniques for microwave measurements Handbook of Microwave Component Measurements is a complete reference to this topic, focusing on the modern measurement tools, such as a Vector Network Analyzer (VNA), gathering in one place all the concepts, formulas, and best practices of measurement science. It includes basic concepts in each chapter as well as appendices which provide all the detail needed to understand the science behind microwave measurements. The book offers an insight into the best practices for ascertaining the true nature of the device-under-test (DUT), optimizing the time to setup and measure, and to the greatest extent possible, remove the effects of the measuring equipment from that result. Furthermore, the author presents information in a way that is easily accessible to the student or new engineer, but complete enough to provide details of measurement science for even the most advanced applications and researchers. Explains the interactions between the device-under-test (DUT) and the measuring equipment by demonstrating the best practices for ascertaining the true nature of the DUT, and optimizing the time to set up and measure Offers a detailed explanation of algorithms and mathematics behind measurements and error correction Provides numerous illustrations (e.g. block-diagrams for circuit connections and measurement setups) and practical examples on real-world devices, which can provide immediate benefit to the reader Written by the principle developer and designer of many of the measurement methods described Includes an accompanying website containing example test scripts for setting up and processing device measurement and data "

• 650 _0 |a Microwave devices |x Testing.

• 650 _7 |a TECHNOLOGY & ENGINEERING / Microwaves. |2 bisacsh

• 920 __ |a 233030 |z 2