机读格式显示(MARC)
- 000 00504nam2 2200181 4500
- 020 __ |a 0-8186-0798-X |c ¥78.60
- 245 1_ |a Integration of test with design and manufacturing: proceedings |c International Test Confernce |g |A INTEGRAT |F INTERNAT
- 260 __ |a New York |b IEEE |c 1987
- 700 _0 |a International Test Confernce |A INTERNAT |4 著
- 905 __ |a HIEL |d TP274053/I1