机读格式显示(MARC)

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• 001 0000251847

• 003 __OCoLC

• 005 20120330110800.0

• 008 030516c19849999cauqr1p 0 a0eng d

• 010 __ |a 91641150 |z sn 83002868

• 022 0_ |a 0740-7475

• 032 __ |a 732250 |b USPS

• 040 __ |a NSD |c NSD |d NST |d IXA |d NST |d NSD |d AIP |d NST |d NSD |d AIP |d NST |d NSD |d NST |d OCL |d NST |d DLC |d OCL |d MYG |d OCL

• 042 __ |a nsdp |a lc

• 050 00 |a TK7885.A1 |b I174

• 082 00 |a 621.395 |2 20

• 090 __ |a TP30/EI1.6

• 093 __ |a TP30 |2 4

• 098 __ |a 730B0001DT

• 210 0_ |a IEEE des. test comput.

• 222 _0 |a IEEE design & test of computers

• 245 10 |a IEEE design & test of computers / |c IEEE Computer Society [and] the Institute of Electrical and Electronics Engineers, Inc.

• 246 3_ |a Institute of Electrical and Electronics Engineers design & test of computers

• 260 __ |a Los Alamitos, CA : |b IEEE Computer Society, |c c1984-

• 300 __ |a 1 |c 1

• 310 __ |a Quarterly, |b Mar. 1991-

• 321 __ |a Quarterly, |b Feb. 1984-

• 321 __ |a Bimonthly, |b <Oct. 1987>-Dec. 1990

• 362 __ |a Vol. 1, no. 1 (Feb. 1984)-

• 500 __ |a Title from cover.

• 515 __ |a Vol. 1, no. 1 also called premiere issue.

• 530 __ |a Available also on microfilm and microfiche from the Institute of Electrical and Electronics Engineers.

• 530 __ |a Beginning 1988 also available by subscription, in PDF format, via the World Wide Web.

• 856 41 |u http://iel.ihs.com/ |z Click on "Go to IEL", then "Search", then "Journals"; scroll down to: IEEE Design & Test of Computers.

• 920 __ |a 233030 |z 2