机读格式显示(MARC)
- 000 00551nam2 2200181 4500
- 245 1_ |a 2nd Microelectronics Measurement Technology Seminar |c Microelectronics Measurement Technology Sdeminar(1980: 2nd : San Jose ) |g |A NDMICROE |F MICROELE
- 260 __ |a Boston |b Benwill |c 1980
- 700 _0 |a Microelectronics Measurement Technology Sdeminar(1980: 2nd : San Jose ) |A MICROELE |4 著
- 905 __ |a HIEL |d TN407/M1