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• 000 01387nam2 2200289 4500

• 001 0000228694

• 005 20060630081118.0

• 008 060630s2005 nyua b 101 0 eng d

• 020 __ |a 0-7803-8824-0(cloth) |c CNY275.00

• 040 __ |a BUPTL

• 093 __ |a TN06-53 |v 4

• 110 2_ |a Reliability and Maintainability Symposium |d (2005 : |c Alexandria, Virginia.)

• 245 10 |a 1989 proceedings, Annual Reliability and Maintainability Symposium : |b Alexandria, Virginia, USA, 2005 January 24-27.

• 246 14 |a 2005 Reliability and Maintainability Symposium.

• 260 __ |a New York, N.Y. : |b Institute of Electrical and Electronics Engineers, |c c2005.

• 300 __ |a 645 p. : |b ill. ; |c 28 cm.

• 500 __ |a Cover title: 2005 Reliability and Maintainability Symposium.

• 504 __ |a Includes bibliographies and indexes.

• 530 __ |a Also available via the World Wide Web with additional title: Reliability and Maintainability Symposium, 2005, proceedings, Annual.

• 650 _0 |a Maintainability (Engineering) |v Congresses.

• 650 _0 |a Reliability (Engineering) |v Congresses.

• 740 01 |a Reliability and Maintainability Symposium, 2005,proceedings, Annual.

• 810 99060630s2006 enka b o10100 eng d |c 20060630

• 851 _0 |a CN |b HIEL

• 856 __ |u http://ieeexplore.ieee.org/servlet/opac?punumber=792 |z Restricted to IEEE Xplore subscribers.

• 905 __ |a HIEL |d TN06-53/R15

• 999 __ |a 22 |b 1 |e 200603