机读格式显示(MARC)
- 000 01083nam a22003378a 4500
- 008 090423s2009 enka b 001 0 eng
- 020 __ |a 9780470511374 (cloth)
- 020 __ |a 0470511370 (cloth)
- 035 __ |a (OCoLC)316009726
- 040 __ |a DLC |c DLC |d YDX |d BTCTA |d YDXCP |d BWX |d CDX |d BWK
- 050 00 |a TK7871.852 |b .V65 2009
- 100 1_ |a Voldman, Steven H.
- 245 10 |a ESD : |b failure mechanisms and models / |c Steven H. Voldman.
- 246 3_ |a Electrostatic discharge.
- 260 __ |a Chichester, West Sussex, U.K. ; |a Hoboken, N.J. : |b J. Wiley, |c 2009.
- 300 __ |a xxiv, 384 p. : |b ill. ; |c 25 cm.
- 504 __ |a Includes bibliographical references and index.
- 650 _0 |a Semiconductors |x Failures.
- 650 _0 |a Integrated circuits |x Protection.
- 650 _0 |a Integrated circuits |x Testing.
- 650 _0 |a Integrated circuits |x Reliability.
- 650 _0 |a Electric discharges.
- 650 _0 |a Electrostatics.