杭州电子科技大学图书馆书目检索系统

Online Public Access Catalogue

题名/责任者:

Transient-induced latchup in CMOS integrated circuits / Ming-Dou Ker and Sheng-Fu Hsu.

出版发行项:

Singapore ; Hoboken, NJ : Wiley ; [Piscataway, NJ] : IEEE Press, c2009.

ISBN:

9780470824078 (cloth)

ISBN:

0470824077 (cloth)

载体形态项:

xiii, 249 p. : ill. ; 26 cm.

个人责任者:

Ker, Ming-Dou.

附加个人名称:

Hsu, Sheng-Fu.

论题主题:

Metal oxide semiconductors, Complementary-Defects.

论题主题:

Metal oxide semiconductors, Complementary-Reliability.

中图法分类号:

TN432

书目附注:

Includes bibliographical references and index.

豆瓣简介：