杭州电子科技大学图书馆书目检索系统

Online Public Access Catalogue

题名/责任者:

Fault diagnosis of analog integrated circuits / by Prithviraj Kabisatpathy, Alok Barua and Satyabroto Sinha.

出版发行项:

Dordrecht : Springer, c2005.

ISBN:

0-387-25742-X(cloth)

载体形态项:

ix, 182 p. : ill. ; 25 cm.

丛编题名:

Frontiers in electronic testing ; 30.

个人责任者:

Kabisatpathy, Prithviraj.

附加个人名称:

Barua, Alok.

附加个人名称:

Sinha, Satyabroto.

丛编团体名称:

20060627

论题主题:

Linear integrated circuits.

论题主题:

Linear integrated circuits-Testing.

中图法分类号:

TN431.1

书目附注:

Includes bibliographical references and index.

豆瓣简介：