杭州电子科技大学图书馆书目检索系统

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题名/责任者:

Testing for small-delay defects in nanoscale CMOS integrated circuits / editors, Sandeep K. Goel, Krishnendu Chakrabarty.

出版发行项:

Boca Raton : CRC Press, c2014.

ISBN:

9781439829417 :

载体形态项:

xv, 247 p. ; 25 cm.

丛编说明:

Devices, circuits, and systems

附加个人名称:

Goel, Sandeep K., editor of compilation.

附加个人名称:

Chakrabarty, Krishnendu, editor of compilation.

论题主题:

Metal oxide semiconductors, Complementary-Testing.

中图法分类号:

TN432

书目附注:

Includes bibliographical references and index.

豆瓣简介：